Optimal Design for Step-Stress Accelerated Test with Random Discrete Stress Elevating Times Based on Gamma Degradation Process

Recently, a step-stress accelerated degradation test (SSADT) plan, in which the stress level is elevated when the degradation value of a product crosses a pre-specified value, was proposed. The times of stress level elevating are random and vary from product to product. In this paper we extend this model to a more economic plan. The proposed extended model has two economical advantages compared with the previous one. The first is that the times of stress level elevating in the new model are identical for all products, which enable us to use only one chamber (oven) for testing all test units. The second is that, the new method does not require continuous inspection and to elevate the stress level, it is not necessary for the experimenter to inspect the value of the degradation continually. The new method decrease the cost of measurement and also there is no need to use electronic sensors to detect the first passage time of the degradation to the threshold value in the new method. We assume that the degradation path follows a gamma process. The stress level is elevated as soon as the measurement of the degradation of one of the test units, at one of the specified times, exceeds the threshold value. Under the constraint that the total experimental cost does not exceed a pre-specified budget, the optimal settings including the optimal threshold value, sample size, measurement frequency and termination time are obtained by minimizing the asymptotic variance of an estimated quantile of the lifetime distribution of the product. A case study is presented to illustrate the proposed method.